Evaluation of a Tantalum-Tip Electrothermal Vaporization Sample Introduction Device for Microwave-Induced Plasma Mass Spectrometry and Atomic Emission Spectrometry

By Evans E. Hywel   Caruso Joseph A.   Satzger R. Duane  

Applied Spectroscopy, Vol. 45, Iss. 9, 1991-11 ,pp. : 1478-1484

Society for Applied Spectroscopy

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A Comparative Study of Electron Density Determination Methodologies in the Helium Microwave-Induced Plasma

By Workman John M.   Fannin Harry B.   Brown Peter G.   Caruso Joseph A.  

Applied Spectroscopy, Vol. 43, Iss. 4, 1989-05 ,pp. : 621-626

Society for Applied Spectroscopy

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Continuous-Flow Determination of Trace Iodine by Atmospheric-Pressure Helium Microwave-Induced Plasma Atomic Emission Spectrometry Using Generation of Volatile Iodine from Iodide

By Nakahara Taketoshi   Yamada Syugo   Wasa Tamotsu  

Applied Spectroscopy, Vol. 44, Iss. 10, 1990-12 ,pp. : 1673-1678

Society for Applied Spectroscopy

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Analytical Feasibility of Graphite Rod Vaporization–Helium Microwave-Induced Plasma (GRV/He-MIP) for Some Nonmetal Determinations

By Abdillahi M. M.  

Applied Spectroscopy, Vol. 47, Iss. 3, 1993-03 ,pp. : 366-374

Society for Applied Spectroscopy

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Aerosol Transport Interface for Electrothermal Vaporization-Microwave-Induced Plasma Emission Spectrometry

By Matusiewicz Henryk   Brovko Igor A.   Sturgeon Ralph E.   Luong Van T.  

Applied Spectroscopy, Vol. 44, Iss. 4, 1990-05 ,pp. : 736-739

Society for Applied Spectroscopy

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