A Simple Device for Studying FT-IR Emission Spectra of Solid Surfaces

Author： Rewick Robert T. Messerschmidt Robert G.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.45, Iss.2, 1991-02, pp. : 297-301

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

A Simple Method of Measuring Emission Spectra with an FT-IR Spectrometer

By Ford M. A. Spragg R. A.

Applied Spectroscopy, Vol. 40, Iss. 5, 1986-07 ,pp. : 715-716

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Discussion of the Stray Light Rejection Efficiency of FT-IR Spectrometers: The Effects of Sample Emission on FT-IR Spectra

By Tripp C. P. McFarlane R. A.

Applied Spectroscopy, Vol. 48, Iss. 9, 1994-09 ,pp. : 1138-1142

Society for Applied Spectroscopy

Access to resources Recommend Favorite

A Simple Device for the Reduction of Background in Single-Beam FT-IR Instruments

By Golding G. Davis B.

Applied Spectroscopy, Vol. 43, Iss. 4, 1989-05 ,pp. : 722-723

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Multicomponent Analysis of FT-IR Spectra

By Saarinen Pekka Kauppinen Jyrki

Applied Spectroscopy, Vol. 45, Iss. 6, 1991-07 ,pp. : 953-963

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Polarization-Modulation Emission FT-IR Measurement of Thin Organic Films on Metal Surfaces

By Tochigi Kenji Momose Hideto Misawa Yutaka Suzuki Takaya

Applied Spectroscopy, Vol. 46, Iss. 1, 1992-01 ,pp. : 156-158

Society for Applied Spectroscopy

Access to resources Recommend Favorite