Author： Chase Bruce Talmi Yair
Publisher： Society for Applied Spectroscopy
ISSN： 0003-7028
Source： Applied Spectroscopy, Vol.45, Iss.6, 1991-07, pp. : 929-931
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Abstract
The performance characteristics of a multielement Ge array detector have been measured. The effects of read noise and dark signal on signal integration have been evaluated. The performance of this array for Raman spectroscopy with excitation at one micron has been compared with FT-Raman spectroscopy. It is an excellent detector for narrow-spectral-bandwidth Raman studies, and the sensitivity compares favorably with that for FT-Raman techniques.
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