Ice/Solid Adhesion Analysis Using Low-Temperature Raman Microprobe Shear Apparatus

Author： Sonwalkar Nishikant   Sunder S. Shyam   Sharma S. K.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.47, Iss.10, 1993-10, pp. : 1585-1593

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