Characterization of Interstitial Oxygen Striations in Silicon Single Crystals by the Micro-FT-IR Method

Author： Iino Eiichi Fusegawa Izumi Yamagishi Hirotoshi

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.47, Iss.9, 1993-09, pp. : 1488-1491

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