Characterization of Quaternary Metal Oxide Films by Synchrotron X-ray Fluorescence Microprobe

Author： Perry D. L. Thompson A. C. Russo R. E. Mao X. L. Chapman K. L.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.51, Iss.12, 1997-12, pp. : 1781-1783

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