Phase-Resolved Depth Profiling of Thin-Layered Plasma Polymer Films by Step-Scan Fourier Transform Infrared Photoacoustic Spectroscopy

Author: Jiang Eric Y.   Palmer Richard A.   Barr Nancy E.   Morosoff Nicholas  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.51, Iss.8, 1997-08, pp. : 1238-1244

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