Fractal Characterization of SERS-Active Electrodes Using Extended Focus Reflectance Microscopy

Author: Yamaguchi Yoshinori   Weldon Millicent K.   Morris Michael D.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.53, Iss.2, 1999-02, pp. : 127-132

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Abstract