Detection of Styrene Impurities in Phenylacetylene by Resonance-Enhanced Multiphoton Ionization Time-of-Flight Mass Spectrometry

Author: Tzeng W. B.   Narayanan K.   Lin J. L.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.53, Iss.6, 1999-06, pp. : 731-734

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