Fourier Transform Infrared Synchrotron Ellipsometry for Studying the Anisotropy of Small Organic Samples

Author： Hinrichs K.   Gensch M.   Röseler A.   Korte E. H.   Sahre K.   Eichhorn K.-J.   Esser N.   Schade U.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.57, Iss.10, 2003-10, pp. : 1250-1253

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