Depth Profiling in Diffusely Scattering Media Using Raman Spectroscopy and Picosecond Kerr Gating

Author： Matousek P. Everall N. Towrie M. Parker A.W.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.59, Iss.2, 2005-02, pp. : 200-205

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