Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy–Tip-Enhanced Raman Spectroscopy

Author： Picardi Gennaro Nguyen Quang Ossikovski Razvigor Schreiber Joachim

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.61, Iss.12, 2007-12, pp. : 1301-1305

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