Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection

Author： Meyer Kent A. Ng Kin C. Gu Zhanjun Pan Zhengwei Whitten William B. Shaw Robert W.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.64, Iss.1, 2010-01, pp. : 1-7

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