AFM-IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization

Author: Dazzi Alexandre   Prater Craig B.   Hu Qichi   Chase D. Bruce   Rabolt John F.   Marcott Curtis  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.66, Iss.12, 2012-12, pp. : 1365-1384

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