Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy

Author： Wirth Richard

Publisher： E. Schweizerbart'sche Verlagsbuchhandlung

ISSN： 0935-1221

Source： European Journal of Mineralogy, Vol.16, Iss.6, 2004-12, pp. : 863-876

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