TOFD IMAGING: Ultrasonic TOFD flaw sizing and imaging in thin plates using embedded signal identification technique (ESIT)

Author: Baskaran G   Balasubramaniam Krishnan   Krishnamurthy C V   Lakshmana Rao C  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.46, Iss.9, 2004-09, pp. : 537-542

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