Author: Bagavathiappan S Saravanan T Philip John Venkatraman B Jayakumar T Raj Baldev
Publisher: The British Institute of Non-Destructive Testing
ISSN: 1354-2575
Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.48, Iss.10, 2006-10, pp. : 597-602
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