Single-sided capacitive imaging for NDT

Author: Diamond G G   Hutchins D A   Gan T H   Purnell P   Leong K K  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.48, Iss.12, 2006-12, pp. : 724-730

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Abstract