Author: Vetterlein T Wagener M Rongen H Sampson C
Publisher: The British Institute of Non-Destructive Testing
ISSN: 1354-2575
Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.48, Iss.3, 2006-03, pp. : 171-173
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Ward C
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 47, Iss. 9, 2005-09 ,pp. :
Statistical process control for short run manufacturing systems
By Yang Su-Fen
Process Control and Quality, Vol. 11, Iss. 5, 2000-01 ,pp. :