Electronic Speckle Pattern Interferometry techniques for non-destructive evaluation: a review

Author： Mujeeb A Nayar V U Ravindran V R

Publisher： The British Institute of Non-Destructive Testing

ISSN： 1354-2575

Source： Insight - Non-Destructive Testing and Condition Monitoring, Vol.48, Iss.5, 2006-05, pp. : 275-281

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