The effect of the defect location on the finite element modelling of defect MFL fields

Author: Cui Wei   Huang Songling   Zhao Wei   Burd John F  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.48, Iss.7, 2006-07, pp. : 402-405

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