Author: Saravanan T Bagavathiappan S Philip John Jayakumar T Raj Baldev
Publisher: The British Institute of Non-Destructive Testing
ISSN: 1354-2575
Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.49, Iss.12, 2007-12, pp. : 701-707
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Segmentation of defects from radiography images by the histogram concavity threshold method
By Saravanan T Bagavathiappan S Philip John Jayakumar T Raj Baldev
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 49, Iss. 10, 2007-10 ,pp. :