Sensitive inspection of void defects using synchrotron refraction imaging with quantitative modelling of contrast enhancement

Author: Imamura K   Inada Y   Ehara N   Umetani K   Nakajima Y  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.51, Iss.1, 2009-01, pp. : 12-15

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