Grown cracks for NDT development and qualification

Author: Virkkunen I   Kempainen M   Ostermeyer H   Paussu R   Dunhill T  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.51, Iss.5, 2009-05, pp. : 271-278

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Abstract