![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Nageswaran C Gooch R Bourgeon A
Publisher: The British Institute of Non-Destructive Testing
ISSN: 1354-2575
Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.54, Iss.11, 2012-11, pp. : 612-618
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Li Jian Zhan Xianglin Jin Shijiu
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 55, Iss. 6, 2013-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Insight - Non-Destructive Testing and Condition Monitoring, Vol. 50, Iss. 12, 2008-12 ,pp. :