Microjoining with a scanning electron microscope

By Knorovsky G. A.   Nowak-Neely B. M.   Holm E. A.  

Science and Technology of Welding & Joining, Vol. 11, Iss. 6, 2006-11 ,pp. : 641-649

Maney Publishing

Access to resources Recommend Favorite

Development of an apertureless near-field optical microscope for fluorescence imaging and spectroscopy

By Diziain S.   Adam P.M.   Bijeon J.L.   Lamy de la Chapelle M.   Royer P.  

Synthetic Metals, Vol. 139, Iss. 3, 2003-10 ,pp. : 557-560

Elsevier

Access to resources Recommend Favorite

Characterization of Si Convertors of Beta-Radiation in the Scanning Electron Microscope

By  

Solid State Phenomena, Vol. 2015, Iss. 242, 2016-02 ,pp. : 312-5

Trans Tech Publications

Access to resources Recommend Favorite

Using a controlled pressure field emission gun scanning electron microscope to acquire EBSD data on non-conductive samples

By  

IOP Conference Series: Materials Science and Engineering, Vol. 32, Iss. 1, 2012-03 ,pp. : 38-43

IOP Publishing

Access to resources Recommend Favorite

In-situ observations of low-cycle fatigue damage in cast AM60B magnesium in an environmental scanning electron microscope

By Gall Ken   Biallas Gerhard   Maier Hans   Gullett Phil   Horstemeyer Mark   McDowell David  

Metallurgical and Materials Transactions A, Vol. 35, Iss. 1, 2004-01 ,pp. : 321-331

Springer Publishing Company

Access to resources Recommend Favorite