Evaluation of Impurity Concentration in Semiconductors from the Relaxation of Thermally Stimulated Currents

Author: Chmyrev V. I.   Skorikov V. M.   Zuev V. V.   Larina E. V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-1685

Source: Inorganic Materials, Vol.40, Iss.7, 2004-07, pp. : 673-679

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