A Universal Fiber-Optic Spectroscope for Studying the Modulated Reflection of Semiconductor Structures

Author: Sotnikov A. E.   Chernikov M. A.   Ryabushkin O. A.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.47, Iss.5, 2004-09, pp. : 656-661

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Abstract