A Method for Measuring the Raman Scattering Spectra of Thin Films

Author: Dianov E. M.   Intyushin E. B.   Koltashev V. V.   Plotnichenko V. G.   Chigirinskii Yu. I.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.47, Iss.5, 2004-09, pp. : 662-664

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