Particle induced X-ray emission spectroscopic (PIXE) and surface morphological (AFM) studies on electron beam evaporated WO₃ thin films

By Sivakumar R.   Ganesan V.   Vijayan V.   Jayachandran M.   Sanjeeviraja C.  

Surface Engineering, Vol. 21, Iss. 4, 2005-08 ,pp. : 315-319

Maney Publishing

Access to resources Recommend Favorite

A Pulsed Low-Hardness X-Ray Source For Radiography in Explosive Experiments

By Boriskin A. S.   Brodsky A. Ya.   Karelin V. I.   Plyashkevich L. N.   Repin P. B.   Rep'ev A. G.   Selemir V. D.  

Instruments and Experimental Techniques, Vol. 46, Iss. 6, 2003-11 ,pp. : 824-827

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

3D scanning by multiple fan beam X-ray sources and sensors

By Benjamin Ralph   Prakoonwit Simant  

Sensor Review, Vol. 25, Iss. 1, 2005-03 ,pp. : 51-55

Emerald Group Publishing Ltd

Access to resources Recommend Favorite

LIGHT ELEMENT WAVELENGTH DISPERSIVE X-RAY ANALYSIS IN SCANNING ELECTRON MICROSCOPE

By Hall M. G.  

Surface Engineering, Vol. 9, Iss. 3, 1993-01 ,pp. : 205-212

Maney Publishing

Access to resources Recommend Favorite

A Method of Electron-Probe X-Ray Spectrum Microanalysis of Individual Particles with the Size Factor Taken Into Account

By Belozerova O.Y.   Pavlova L.A.   Finkel'shtein A.L.  

Industrial Laboratory, Vol. 66, Iss. 9, 2000-09 ,pp. : 565-568

Springer Publishing Company

Access to resources Recommend Favorite