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Instruments and Experimental Techniques, Vol. 54, Iss. 3, 2011-05 ,pp. : 400-408

MAIK Nauka/Interperiodica

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A precise system for measuring weak optoacoustic perturbations

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Instruments and Experimental Techniques, Vol. 53, Iss. 3, 2010-05 ,pp. : 423-429

MAIK Nauka/Interperiodica

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Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

By Alaie Seyedhamidreza   Goettler Drew F   Jiang Ying-Bing   Abbas Khawar   Anjum D H   Chaieb S   Leseman Zayd C   Alaie Seyedhamidreza  

Nanotechnology, Vol. 26, Iss. 8, 2015-02 ,pp. : 85704-85711

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A simple method for measuring time-of-flight spectra of a gas-dynamic molecular beam

By Azriel V.   Akimov V.   Rusin L.  

Instruments and Experimental Techniques, Vol. 50, Iss. 3, 2007-05 ,pp. : 366-369

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Etching characteristics of a silicon surface induced by focused ion beam irradiation

By Kawasegi Noritaka   Morita Noboru   Yamada Shigeru   Takano Noboru   Oyama Tatsuo   Ashida Kiwamu   Taniguchi Jun   Miyamoto Iwao   Momota Sadao  

International Journal of Manufacturing Technology and Management, Vol. 9, Iss. 1-2, 2006-06 ,pp. : 34-50

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