Absolute calibration of X-ray optical elements and detectors at a wavelength of 46.9 nm

Author: Gilev O.   Vikhlyaev D.   Legkodymov A.   Nikolenko A.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.53, Iss.6, 2010-11, pp. : 873-876

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Abstract