A precise inspection technique for wafer pre-sawing lines using Affine transformation

Author: Kim Hyung Tae   Lee Kang Won   Kim Sung-Chul   Yang Hae-Jeong  

Publisher: Inderscience Publishers

ISSN: 0952-8091

Source: International Journal of Computer Applications in Technology, Vol.39, Iss.1-3, 2010-08, pp. : 46-52

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Abstract