Author： Shishkin A. Basin A.
Publisher： MAIK Nauka/Interperiodica
ISSN： 0040-5795
Source： Theoretical Foundations of Chemical Engineering, Vol.38, Iss.6, 2004-11, pp. : 660-668
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Abstract
Experimental data on the surface tension of liquid silicon are analyzed. The effect of oxygen and other impurities is discussed. A large body of data is statistically processed. The expression σ = 0.82–0.3 × 10−3 (
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