Second Generation of Correction Methods in Electron Probe X-ray Microanalysis: Approximation Models for Emission Depth Distribution Functions

Author： Lavrent'ev Yu. G.   Korolyuk V. N.   Usova L. V.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1061-9348

Source： Journal of Analytical Chemistry, Vol.59, Iss.7, 2004-07, pp. : 600-616

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