An improved method for predicting microfabrication influence in atomic force microscopy performances

Author： Rinaldi Gino Packirisamy Muthukumaran Stiharu Ion

ISSN： 1475-7435

Source： International Journal of Nanotechnology, Vol.1, Iss.3, 2004-07, pp. : 292-306

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Atomic Force Microscopy Simulation by MD/Continuum Coupling Method

By Senda Yasuhiro Imahashi Nobuyuki Shimamura Shuji Blomqvist Janne Nieminen Risto

Integrated Ferroelectrics, Vol. 155, Iss. 1, 2014-07 ,pp. : 33-38

Taylor & Francis Ltd

Access to resources Recommend Favorite

Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

Nanotechnology, Vol. 26, Iss. 4, 2015-01 ,pp. : 45701-45709

IOP Publishing

Access to resources Recommend Favorite

Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis

By Kareem Adam U Solares Santiago D

Nanotechnology, Vol. 23, Iss. 1, 2012-01 ,pp. : 15706-15719

IOP Publishing

Access to resources Recommend Favorite

Atomic force microscopy of scratch damage in polypropylene

By Dasari A. Duncan S. J. Misra R. D. K.

Materials Science and Technology, Vol. 18, Iss. 10, 2002-10 ,pp. : 1227-1234

Maney Publishing

Access to resources Recommend Favorite

Single-crystal diamond probes for atomic-force microscopy

By Kopylov P. Loginov B. Ismagilov R. Obraztsov A.

Instruments and Experimental Techniques, Vol. 53, Iss. 4, 2010-07 ,pp. : 613-619

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite