A compact model for electrostatic discharge protection nanoelectronics simulation

Author: Chou Hung-Mu   Yu Shao-Ming   Lee Jam-Wem   Li Yiming  

Publisher: Inderscience Publishers

ISSN: 1475-7435

Source: International Journal of Nanotechnology, Vol.2, Iss.3, 2005-11, pp. : 226-238

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Abstract