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MAIK Nauka/Interperiodica

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Analysis of the low-frequency dispersion of the dielectric parameters in As_xSe_1-x amorphous layers

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Development of non-stoichiometric SrBi_4+2xTi₄O_15+3x (−0·04 ≤x≤ 0·04) ceramics

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Structure of the mixed oxides Me _x (Ce_0.5Zr_0.5)_1−x O _y (Me = Gd, Pr)

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