MicroRaman and phase stepping microscopy analysis of growth defects in GaAs/GaAs epilayers

Author: Mártín P.   Ramos J.   Jiménez J.   Sanz L. F.   González M. A.  

Publisher: Maney Publishing

ISSN: 1743-2847

Source: Materials Science and Technology, Vol.14, Iss.12, 1998-12, pp. : 1286-1290

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