![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Brown N. Jaatinen E. Suh H. Howick E. Xu G. Veldman I. Chartier A. Chartier J.-M.
Publisher: IOP Publishing
ISSN: 0026-1394
Source: Metrologia, Vol.37, Iss.2, 2000-07, pp. : 107-113
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Abramova L. Zakharenko Yu. Fedorine V. Blajev T. Kartaleva S. Karlsson H. Popescu GH. Chartier A. Chartier J.-M.
Metrologia, Vol. 37, Iss. 2, 2000-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Shen S. Qian J. Liu Z. Shi C. Wang L. Iwasaki S. Ishikawa J. Hong F.-L. Suh H. S. Labot J. Chartier A. Chartier J.-M. Ni Y. An J.
Metrologia, Vol. 38, Iss. 2, 2001-04 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Matus M. Balling P. Šmid M. Walczuk J. Bánréti E. Tomanyiczka K. Popescu Gh. Chartier A. Chartier J.-M.
Metrologia, Vol. 39, Iss. 1, 2002-02 ,pp. :