Author: Cordiale P. Galzerano G. Schnatz H.
Publisher: IOP Publishing
ISSN: 0026-1394
Source: Metrologia, Vol.37, Iss.2, 2000-07, pp. : 177-182
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A 633 nm iodine-stabilized diode-laser frequency standard
By Edwards C. S. Barwood G. P. Gill P. Rowley W. R. C.
Metrologia, Vol. 36, Iss. 1, 1999-01 ,pp. :
International comparison of eight semiconductor lasers stabilized on 127I2 at λ ≈ 633 nm
By Zarka A. Abou-Zeid A. Chagniot D. Chartier J.-M. Cíp O. Cliche J.-F. Edwards C. S. Imkenberg F. Jedlićka P. Kabel B. Lassila A. Lazar J. Merimaa M. Millerioux Y. Simonsen H. Têtu M. Wallerand J.-P.
Metrologia, Vol. 37, Iss. 4, 2000-10 ,pp. :