Comparison of resistance standards between the National Institute of Metrology (China) and the Electrotechnical Laboratory (Japan)

Author： Nakanishi M.   Kinoshita J.   Endo T.   Zhang Z.   Shao H.   He Q.   Liang B.  

Publisher： IOP Publishing

ISSN： 0026-1394

Source： Metrologia, Vol.39, Iss.2, 2002-04, pp. : 207-212

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