Accuracy evaluation of NIST-F1

Author: Jefferts S. R.   Shirley J.   Parker T. E.   Heavner T. P.   Meekhof D. M.   Nelson C.   Levi F.   Costanzo G.   De Marchi A.   Drullinger R.   Hollberg L.   Lee W. D.   Walls F. L.  

Publisher: IOP Publishing

ISSN: 0026-1394

Source: Metrologia, Vol.39, Iss.4, 2002-12, pp. : 321-336

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Abstract