Author： Vitushkin L. Becker M. Jiang Z. Francis O. van Dam T. M. Faller J. Chartier J.-M. Amalvict M. Bonvalot S. Debeglia N. Desogus S. Diament M. Dupont F. Falk R. Gabalda G. Gagnon C. G. L. Gattacceca T. Germak A. Hinderer J. Jamet O. Jeffries G. Käker R. Kopaev A. Liard J. Lindau A. Longuevergne L. Luck B. Maderal E. N. Mäkinen J. Meurers B. Mizushima S. Mrlina J. Newell D. Origlia C. Pujol E. R. Reinhold A. Richard Ph. Robinson I. A. Ruess D. Thies S. van Camp M. van Ruymbeke M. de Villalta Compagni M. F. Williams S.
Publisher： IOP Publishing
ISSN： 0026-1394
Source： Metrologia, Vol.39, Iss.5, 2002-12, pp. : 407-424
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