Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM)

Author： Cheng X M   Keavney D J  

Publisher： IOP Publishing

ISSN： 0034-4885

Source： Reports on Progress in Physics, Vol.75, Iss.2, 2012-02, pp. : 26501-26529

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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