On the Voltage and Frequency Distribution of Dielectric Properties and ac Electrical Conductivity in Al/SiO2/p-Si (MOS) Capacitors

Author: Kaya Ahmet   Altındal Şemsettin   Asar Yasemin Şafak   Sönmez Zekayi  

Publisher: IOP Publishing

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.30, Iss.1, 2013-01, pp. : 17301-17304

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Abstract