Comparison of spin lifetimes in n-Ge characterized between three-terminal and four-terminal nonlocal Hanle measurements

Author： Chang L-T Han W Zhou Y Tang J Fischer I A Oehme M Schulze J Kawakami R K Wang K L

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.28, Iss.1, 2013-01, pp. : 15018-15024

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