Critical behavior near the Lifshitz point in Sn2P2(S1 − xSex)6 ferroelectric semiconductors from thermal diffusivity measurements

Author: Oleaga A   Salazar A   Kohutych A A   Vysochanskii Yu M  

Publisher: IOP Publishing

ISSN: 0953-8984

Source: Journal of Physics: Condensed Matter, Vol.23, Iss.2, 2011-01, pp. : 25902-25909

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