Defect properties of ZnO nanowires revealed from an optically detected magnetic resonance study

Author: Stehr J E   Chen S L   Filippov S   Devika M   Reddy N Koteeswara   Tu C W   Chen W M   Buyanova I A  

Publisher: IOP Publishing

ISSN: 0957-4484

Source: Nanotechnology, Vol.24, Iss.1, 2013-01, pp. : 15701-15705

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