Stress-induced roughness development during oxide scale growth on a metallic alloy for SOFC interconnects

Author： Saillard Audric   Cherkaoui Mohammed    

Publisher： IOP Publishing

ISSN： 0965-0393

Source： Modelling and Simulation in Materials Science and Engineering, Vol.19, Iss.1, 2011-01, pp. : 15009-15024

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